ENTMISCHUNGSVORGAENGE NACH DEM NITRIEREN = PROCESSUS DE DESHOMOGENEISATION APRES NITRURATIONKUBALEK E.1975; HAERT.-TECH. MITT.; DTSCH.; DA. 1975; VOL. 30; NO 5; PP. 283-287; BIBL. 7 REF.Article

HIGH-TEMPERATURE X-RAY TOPOGRAPHY SYSTEM FOR THE INVESTIGATION OF SEMICONDUCTOR SINGLE CRYSTATS.HASTENRATH M; KRUEGER HE; KUBALEK E et al.1977; REV. SCI. INSTRUM.; U.S.A.; DA. 1977; VOL. 48; NO 6; PP. 605-609; BIBL. 16 REF.Article

MICROCHARACTERIZATION OF ELECTROLUMINESCENT DIODES WITH THE SCANNING ELECTRON MICROSCOPE (SEM).BALK LJ; KUBALEK E; MENZEL E et al.1975; I.E.E.E. TRANS. ELECTRON DEVICES; U.S.A.; DA. 1975; VOL. 22; NO 9; PP. 707-712; BIBL. 13 REF.Article

Electron and optical beam testing of integrated circuits, October 1-4, 1989, Duisburg Federal Republic of GermanyKUBALEK, E; WOLFGANG, E.Microelectronic engineering. 1990, Vol 12, Num 1-4, issn 0167-9317, 452 p.Conference Proceedings

On the electronic structure and the local distribution of the second phase Ba₆Ti₁₇O₄₀ in BaTiO₃ ceramicsKOSCHEK, G; KUBALEK, E.Physica status solidi. A. Applied research. 1987, Vol 102, Num 1, pp 417-424, issn 0031-8965Article

Rasterelektronenmikroskopische Direktabbildung von ferroelektrischen Domänen in BaTiO₃-Keramiken durch Sekundärelektronen und Kathodolumineszenz = Formation directe d'image des domaines ferroélectriques par microscopie électronique à balayage dans des céramiques de BaTiO₃ au moyen d'électrons secondaires et de cathodoluminescence = Scanning electron microscopy direct imaging of ferroelectric domains in BaTiO₃ ceramics by means of secondary electrons and cathodoluminescenceKOSCHEK, G; KUBALEK, E.Physica status solidi. A. Applied research. 1987, Vol 100, Num 1, pp 355-368, issn 0031-8965Article

Cathodoluminescence from deformed ZnO ceramicsPIQUERAS, J; KUBALEK, E.Solid state communications. 1985, Vol 54, Num 6, pp 745-746, issn 0038-1098Article

QUANTITATIVE DETERMINATION OF SURFACE POTENTIALS ON INTEGRATED CIRCUITS (IC) AT HIGH FREQUENCIES WITH THE SCANNING ELECTRON MICROSCOPE (SEM).BALK LJ; FEUERBAUM HP; KUBALEK E et al.1975; IN: INT. ELECTRON DEVICES MEET.; WASHINGTON, D.C.; 1975; NEW YORK; INST. ELECTR. ELECTRON. ENG.; DA. 1975; PP. 115-118; BIBL. 12 REF.Conference Paper

Spatially resolved cathodoluminescence investigations on zinc oxide ceramicsKÖHLER, D; KUBALEK, E.Physica status solidi. A. Applied research. 1987, Vol 100, Num 1, pp 337-342, issn 0031-8965Article

Grain-boundary characteristics and their influence on the electrical resistance of barium titanate ceramicsKOSCHEK, G; KUBALEK, E.Journal of the American Ceramic Society. 1985, Vol 68, Num 11, pp 582-586, issn 0002-7820Article

ORIENTATION DEPENDENT GROWTH AND LUMINESCENCE OF SELECTIVE GAAS-SN LPE.KONIG U; LANGMANN U; HEIME K et al.1976; J. CRYST. GROWTH; NETHERL.; DA. 1976; VOL. 36; NO 1; PP. 165-170; BIBL. 22 REF.Article

Digital signal measurements with electric force microscope testingBANGERT, J; KUBALEK, E.Surface and interface analysis. 1999, Vol 27, Num 5-6, pp 307-311, issn 0142-2421Conference Paper

Circuit internal logic analysis with Electric Force Microscope- (EFM-) testingBANGERT, J; KUBALEK, E.Microelectronics and reliability. 1998, Vol 38, Num 6-8, pp 951-956, issn 0026-2714Conference Paper

Vacancy diffusion profiles at the grain boundaries of electronic ceramicsKÖHLER, D; KOSCHEK, G; KUBALEK, E et al.Physica status solidi. A. Applied research. 1988, Vol 105, Num 2, pp 377-385, issn 0031-8965Article

Diagnosis in submicron integrated circuits by electric force microscopyBÖHM, C; SPRENGEPIEL, J; KUBALEK, E et al.Microelectronics and reliability. 1996, Vol 36, Num 7-8, pp 1113-1118, issn 0026-2714Article

Three-dimensional magnetic field measurement of a modified thin-film magnetic head for vertical recording by means of Lorentz-tomographySTECK, M; SCHEWE, H; KUBALEK, E et al.IEEE transactions on magnetics. 1990, Vol 26, Num 5, pp 1343-1345, issn 0018-9464, 3 p.Conference Paper

Arrangement of the acetylcholine receptor subunits in the resting and desensitized states, determined by cryoelectron microscopy of crystallized Torpedo postsynaptic membranesUNWIN, N; TOYOSHIMA, C; KUBALEK, E et al.The Journal of cell biology. 1988, Vol 107, Num 3, pp 1123-1138, issn 0021-9525Article

Location of subunits within the acetylcholine receptor by electron image analysis of tubular crystals from Torpedo marmorataKUBALEK, E; RALSTON, S; LINDSTROM, J et al.The Journal of cell biology. 1987, Vol 105, Num 1, pp 9-18, issn 0021-9525Article

On the origin of cathodoluminescence contrast phenomana in semiinsulating GaAsKOSCHEK, G; LAKNER, H; KUBALEK, E et al.Physica status solidi. A. Applied research. 1988, Vol 106, Num 2, pp 651-658, issn 0031-8965Article

Absolute quantitative time resolved voltage measurements on 1 μm conducting lines of integrated circuits via electric force microscope-(EFM-) testingBANGERT, J; KUBALEK, E.Microelectronics and reliability. 1997, Vol 37, Num 10-11, pp 1579-1582, issn 0026-2714Conference Paper

A novel method for time-resolved characterization of micromagnetic stray fields with scanning probe microscopyBANGERT, J; KASIM, S; MERTIN, W et al.Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 533-536, issn 0142-2421Conference Paper

Voltage contrast studies on 0.5 μm integrated circuits by scanning force microscopyBÖHM, C; SPRENGEPIEL, J; KUBALEK, E et al.Quality and reliability engineering international. 1995, Vol 11, Num 4, pp 253-256, issn 0748-8017Conference Paper

Study of overgrowth heterostructure InSb/GaAs by scanning electron acoustic microscopySHUWEI LI; KUBALEK, E; YIXIN JIN et al.Journal of materials science. 1999, Vol 34, Num 11, pp 2561-2564, issn 0022-2461Article

The influence of structural defects in ZnSe/GaAs heterostructures on luminescence propertiesLIU, Q; LAKNER, H; MENDORF, C et al.Journal of physics. D, Applied physics (Print). 1998, Vol 31, Num 19, pp 2421-2425, issn 0022-3727Article

MMIC in-circuit and in-device testing with an on-wafer high frequency electric force microscope test systemLEYK, A; VAN WAASEN, S; TEGUDE, F. J et al.Microelectronics and reliability. 1997, Vol 37, Num 10-11, pp 1575-1578, issn 0026-2714Conference Paper